Aerodynamics part 2. Methods of aerodynamic calculations by Krasnov N.F.

By Krasnov N.F.

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New Developments in Semiconductor Physics

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In the computation, the p-polarized incoming field (λ = 633 nm) was adjusted to fit the experimental conditions: total internal reflection with an angle of incidence equal to 55 degrees, and with the projection of the incident wave vector onto the surface of the substrate pointing mostly towards the y direction but with a slight tilt towards the upper left corner of the images. The numerical solution was obtained by applying Green’s dyadic technique [25], discretizing a single Au particle into 10 × 10 × 10 nm3 cubic cells.

Figure 12 illustrates a configuration employed in constructing a reflection mode apertureless NSOM [15]. The sample surface nearest to the probe tip is illuminated by light that is incident at a large angle relative to the surface plane. The light field that is scattered by both the probe tip and the sample is collected into a photo detector using external optics. The tip is scanned across the sample surface to produce a near-field optical image of the sample surface. Specular reflection of the incident light cannot enter the photo detector if the angle of incidence is made larger than the observation angle of the external optics.

The illumination light was in the TM mode (p-polarized). The scattered light from the scatterer was detected with an analyzer in the p polarization. The entire image has surface dimensions of 10µm × 10µm and was sampled at scanning steps of 40 nm. Figure 11b shows an STM image which represents the geometric surface structures of the same area as shown in Fig. 11a. Unlike the STM image, the NSOM image does not represent the geometric structure of the sample, but represents the localized evanescent field near the sample.

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